Materials Characterization




Los Alamos has a wide array of materials characterization instrumentation which can be applied to tritiated materials.  Instrumentation includes XPS, Scanning Auger, SEM, SIMMS,  sputtered neutrals, metallography and solid state tritium surface concentration measurement.  Using this capability a series of studies were performed on TFTR tiles which had been used during D-T operations.

For more information on this capability contact Mark Paffett, Bob Reiswig or Scott Willms.


Micrograph of TFTR graphite tile surface showing the codeposited graphite layer, about 100 microns thick (picture at 200X magnification)

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This site was last updated 04/02/02